{"id":3692,"date":"2023-05-17T15:05:35","date_gmt":"2023-05-17T13:05:35","guid":{"rendered":"https:\/\/www.cff-fiabilite.fr\/?post_type=tribe_events&#038;p=3692"},"modified":"2024-09-04T10:15:43","modified_gmt":"2024-09-04T08:15:43","slug":"imaps-empc2025","status":"publish","type":"tribe_events","link":"https:\/\/www.cff-fiabilite.fr\/evenements\/imaps-empc2025\/","title":{"rendered":"IMAPS &#8211; EMPC2025 &#8211; Grenoble"},"content":{"rendered":"<p><span>La conf\u00e9rence europ\u00e9enne sur la micro\u00e9lectronique et l&#8217;emballage (EMPC 2025) est la premi\u00e8re conf\u00e9rence internationale sur l&#8217;emballage micro\u00e9lectronique, d\u00e9tenue et sponsoris\u00e9e par IMAPS-Europe et co-sponsoris\u00e9e par IEEE-EPS.<\/span><\/p>\n<p><span>Le programme de la conf\u00e9rence sera ax\u00e9 sur les besoins et les tendances de l&#8217;industrie ainsi que sur les solutions acad\u00e9miques \u00e0 long terme. L&#8217;\u00e9v\u00e9nement r\u00e9unira des chercheurs, des innovateurs, des technologues, des responsables commerciaux et marketing int\u00e9ress\u00e9s par le packaging des semi-conducteurs.<\/span><\/p>\n<div class=\"et_pb_module et_pb_text et_pb_text_2  et_pb_text_align_left et_pb_bg_layout_light\">\n<div class=\"et_pb_text_inner\">\n<p><span>Co-parrain\u00e9 par<\/span><\/p>\n<\/div>\n<\/div>\n<div class=\"et_pb_module et_pb_image et_pb_image_1\"><span class=\"et_pb_image_wrap \"><img loading=\"lazy\" decoding=\"async\" class=\"wp-image-34\" title=\"ouais\" src=\"https:\/\/empc2025.org\/wp-content\/uploads\/2024\/03\/ieeeps.gif\" alt=\"\" width=\"2122\" height=\"624\" \/><\/span><\/div>\n","protected":false},"excerpt":{"rendered":"<p>La conf\u00e9rence europ\u00e9enne sur la micro\u00e9lectronique et l&#8217;emballage (EMPC 2025) est la premi\u00e8re conf\u00e9rence internationale sur l&#8217;emballage micro\u00e9lectronique, d\u00e9tenue et sponsoris\u00e9e par IMAPS-Europe et co-sponsoris\u00e9e par IEEE-EPS. Le programme de [&hellip;]<\/p>\n","protected":false},"author":15,"featured_media":4237,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"_et_pb_use_builder":"","_et_pb_old_content":"","_et_gb_content_width":"","_tribe_events_status":"","_tribe_events_status_reason":"","footnotes":""},"tags":[],"tribe_events_cat":[97],"class_list":["post-3692","tribe_events","type-tribe_events","status-publish","has-post-thumbnail","hentry","tribe_events_cat-relaye-par-le-cff","cat_relaye-par-le-cff"],"acf":[],"_links":{"self":[{"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/tribe_events\/3692","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/tribe_events"}],"about":[{"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/types\/tribe_events"}],"author":[{"embeddable":true,"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/users\/15"}],"replies":[{"embeddable":true,"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/comments?post=3692"}],"version-history":[{"count":5,"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/tribe_events\/3692\/revisions"}],"predecessor-version":[{"id":4257,"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/tribe_events\/3692\/revisions\/4257"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/media\/4237"}],"wp:attachment":[{"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/media?parent=3692"}],"wp:term":[{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/tags?post=3692"},{"taxonomy":"tribe_events_cat","embeddable":true,"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/tribe_events_cat?post=3692"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}