34e Symposium ESREF (European Symposium on Reliability of Electron Devices, Failure Physics and Analysis)<\/p>\n
This international symposium continues to focus on recent developments and future directions in Quality and Reliability Management of materials, devices
\nand circuits for micro-, nano-, and optoelectronics. It provides a European forum for developing all aspects of reliability management and innovative analysis
\ntechniques for present and future electronic applications.<\/p>\n
For this 34th edition, in addition to the core topics of the conference, we would like to involve the major actors of aeronautics, space and embedded systems industry to provide specific topics such as radiation hardening, very long-term reliability, high\/low temperature challenges, obsolescence and counterfeit issues, wide bandgap power devices for the more electric aircraft and other embedded system applications. In the continuity of previous conferences, ESREF 2023 is also hosting several workshops and welcomes new ones related to these specific topics.<\/p>\n
We are looking forward to welcoming you for a memorable experience!<\/p>\n
ESREF 2023 Chair : Nicolas NOLHIER
\nESREF 2023 Vice-Chair : Guillaume BASCOUL
\nTechnical Program Chairs : H\u00e9l\u00e8ne FREMONT, Nathalie LABAT, Fran\u00e7ois MARC<\/p>\n","protected":false},"excerpt":{"rendered":"
34e Symposium ESREF (European Symposium on Reliability of Electron Devices, Failure Physics and Analysis) This international symposium continues to focus on recent developments and future directions in Quality and Reliability […]<\/p>\n","protected":false},"author":15,"featured_media":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"_et_pb_use_builder":"","_et_pb_old_content":"","_et_gb_content_width":"","_tribe_events_status":"","_tribe_events_status_reason":"","footnotes":""},"tags":[],"tribe_events_cat":[97],"class_list":["post-3704","tribe_events","type-tribe_events","status-publish","hentry","tribe_events_cat-relaye-par-le-cff","cat_relaye-par-le-cff"],"acf":[],"_links":{"self":[{"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/tribe_events\/3704","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/tribe_events"}],"about":[{"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/types\/tribe_events"}],"author":[{"embeddable":true,"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/users\/15"}],"replies":[{"embeddable":true,"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/comments?post=3704"}],"version-history":[{"count":1,"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/tribe_events\/3704\/revisions"}],"predecessor-version":[{"id":3705,"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/tribe_events\/3704\/revisions\/3705"}],"wp:attachment":[{"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/media?parent=3704"}],"wp:term":[{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/tags?post=3704"},{"taxonomy":"tribe_events_cat","embeddable":true,"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/tribe_events_cat?post=3704"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}