{"id":4121,"date":"2024-04-11T09:23:13","date_gmt":"2024-04-11T07:23:13","guid":{"rendered":"https:\/\/www.cff-fiabilite.fr\/?post_type=tribe_events&p=4121"},"modified":"2024-04-11T09:23:13","modified_gmt":"2024-04-11T07:23:13","slug":"esref-2024","status":"publish","type":"tribe_events","link":"https:\/\/www.cff-fiabilite.fr\/evenements\/esref-2024\/","title":{"rendered":"ESREF 2024"},"content":{"rendered":"

35e Symposium ESREF (= European Symposium on Reliability of Electron Devices, Failure Physics and Analysis)<\/p>\n

Chair = PAOLO COVA University of Parma (IT)
\nVice-Chair = NICOLA DELMONTE University of Parma (IT)<\/span><\/p>\n

https:\/\/www.esref2024.org\/<\/p>\n

ESREF 2024,\u00a0the 35th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, will take place in Parma, Italy, from September 23 to 26, 2024.<\/span><\/p>\n

This International Symposium will continue its 35-year history of focusing on the latest research developments and future directions in failure analysis, quality and reliability of materials, devices and circuits for microelectronics and optoelectronics, power, space, and automotive electronics. It historically provides an European forum to develop all aspects of reliability, including management and advanced failure analysis techniques for present and emerging semiconductor applications.\u00a0<\/span><\/p>\n","protected":false},"excerpt":{"rendered":"

35e Symposium ESREF (= European Symposium on Reliability of Electron Devices, Failure Physics and Analysis) Chair = PAOLO COVA University of Parma (IT) Vice-Chair = NICOLA DELMONTE University of Parma […]<\/p>\n","protected":false},"author":15,"featured_media":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"_et_pb_use_builder":"","_et_pb_old_content":"","_et_gb_content_width":"","_tribe_events_status":"","_tribe_events_status_reason":"","footnotes":""},"tags":[],"tribe_events_cat":[],"class_list":["post-4121","tribe_events","type-tribe_events","status-publish","hentry"],"acf":[],"_links":{"self":[{"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/tribe_events\/4121","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/tribe_events"}],"about":[{"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/types\/tribe_events"}],"author":[{"embeddable":true,"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/users\/15"}],"replies":[{"embeddable":true,"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/comments?post=4121"}],"version-history":[{"count":1,"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/tribe_events\/4121\/revisions"}],"predecessor-version":[{"id":4123,"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/tribe_events\/4121\/revisions\/4123"}],"wp:attachment":[{"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/media?parent=4121"}],"wp:term":[{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/tags?post=4121"},{"taxonomy":"tribe_events_cat","embeddable":true,"href":"https:\/\/www.cff-fiabilite.fr\/wp-json\/wp\/v2\/tribe_events_cat?post=4121"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}